1～1件／全1件 セーフサーチON
  •  
Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)
  • 洋書
  • 電子版あり

Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Image Processing, Computer Vision, Pattern Recognition, and Graphics)  Paperback,  言語：ENG

Bai, Xiao (EDT)/ Hancock, Edwin R. (EDT)/ Ho, Tin Kam (EDT)

  • Springer International Publishing AG（2018/08発売）
  • ご注文いただけません
1～1件／全1件
  •