Knowledge Science, Engineering and Management : 14th International Conference, KSEM 2021, Tokyo, Japan, August 14-16, 2021, Proceedings, Part II (Lecture Notes in Artificial Intelligence)
  • 洋書

Knowledge Science, Engineering and Management : 14th International Conference, KSEM 2021, Tokyo, Japan, August 14-16, 2021, Proceedings, Part II (Lecture Notes in Artificial Intelligence)  Paperback

Qiu, Han (EDT)/ Zhang, Cheng (EDT)/ Fei, Zongming (EDT)

  • ウェブストア価格 ¥12,155(本体¥11,050)
  • Springer Nature Switzerland AG(2021/07発売)
  • ポイント 110pt
  • 海外取次在庫
Knowledge Science, Engineering and Management : 14th International Conference, KSEM 2021, Tokyo, Japan, August 14-16, 2021, Proceedings, Part III (Lecture Notes in Artificial Intelligence)
  • 洋書

Knowledge Science, Engineering and Management : 14th International Conference, KSEM 2021, Tokyo, Japan, August 14-16, 2021, Proceedings, Part III (Lecture Notes in Artificial Intelligence)  Paperback,  言語:ENG

Qiu, Han (EDT)/ Zhang, Cheng (EDT)/ Fei, Zongming (EDT)

  • ウェブストア価格 ¥22,102(本体¥20,093)
  • Springer Nature Switzerland AG(2021/07発売)
  • ポイント 200pt
  • 海外取次在庫
Knowledge Science, Engineering and Management : 14th International Conference, KSEM 2021, Tokyo, Japan, August 14-16, 2021, Proceedings, Part I (Lecture Notes in Artificial Intelligence)
  • 洋書

Knowledge Science, Engineering and Management : 14th International Conference, KSEM 2021, Tokyo, Japan, August 14-16, 2021, Proceedings, Part I (Lecture Notes in Artificial Intelligence)  Paperback

Qiu, Han (EDT)/ Zhang, Cheng (EDT)/ Fei, Zongming (EDT)

  • ウェブストア価格 ¥24,313(本体¥22,103)
  • Springer Nature Switzerland AG(2021/07発売)
  • ポイント 221pt
  • 海外取次在庫
Measurement Technology for Micro-Nanometer Devices
  • 洋書
  • 電子版あり

Measurement Technology for Micro-Nanometer Devices  Hardcover,  言語:ENG

Zhang, Wendong/ Chou, Xiujian/ Shi, Tiekin/ Ma, Zongmin/ Bao, Haifei

  • ウェブストア価格 ¥38,122(本体¥34,657)
  • John Wiley & Sons Inc(2017/01発売)
  • ポイント 346pt
  • 海外からお取り寄せ(通常6~9週間)