Experimental Techniques for Low-Temperature Measurements : Cryostat Design, Material Properties and Superconductor Critical-Current Testing
  • 洋書

Experimental Techniques for Low-Temperature Measurements : Cryostat Design, Material Properties and Superconductor Critical-Current Testing  Hardcover,  言語:ENG

Ekin, Jack

  • ウェブストア価格 ¥38,297(本体¥34,816)
  • Oxford University Press(2006/10発売)
  • ポイント 348pt
  • 海外取次在庫