Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)
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Metal Impurities in Silicon- and Germanium-Based Technologies : Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science)  Paperback,  言語:ENG

Claeys, Cor/ Simoen, Eddy

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  • Springer Nature Switzerland AG(2019/01発売)
  • ポイント 798pt
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