Next Generation Technology-Enhanced Assessment : Global Perspectives on Occupational and Workplace Testing
  • 洋書電子書籍
  • 電子書籍

Next Generation Technology-Enhanced Assessment : Global Perspectives on Occupational and Workplace Testing  言語:ENG

Scott, John C. (EDT)/Bartram, Dave (EDT)/Reynolds, Douglas H. (EDT)

  • 価格 ¥4,888(本体¥4,444)
  • Cambridge University Press(2017/12/28発売)
  • ポイント 44pt (実際に付与されるポイントはご注文内容確認画面でご確認下さい)