LabVIEW Run Four Point Probe Device : Electrical Characterization of Semiconducting Thin Films made easy by Four Point Probe System controlled by LabVIEW (Aufl. 2012. 140 S. 220 mm)
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LabVIEW Run Four Point Probe Device : Electrical Characterization of Semiconducting Thin Films made easy by Four Point Probe System controlled by LabVIEW (Aufl. 2012. 140 S. 220 mm)  Paperback

Agumba, John/ Karimi, Patrick/ Okumu, John

  • ウェブストア価格 ¥14,595(本体¥13,269)
  • LAP LAMBERT ACADEMIC PUBLISHING(2012発売)
  • ポイント 132pt
  • オンデマンド(OD/POD)版です。キャンセルは承れません。