Description
How to apply XPS and related techniques??with real-world case studies
X-ray photoelectron spectroscopy has become the most heavily used technique for characterizing the composition and chemistry of solid surfaces. X-ray Photoelectron Spectroscopy: An Introduction to Principles and Practices, Second Edition, delivers thoroughly revised coverage (along with two new chapters) reflecting significant advances since the first edition. Paul van der Heide, with decades of hands-on experience in surface analysis, guides readers from foundational concepts to practical applications.
This starts with a prelude on the discovery of photoelectron emission to the impact of surface science. Hardware from both a components and system level are then introduced with a short foray into related techniques (such as HAXPES and NAP-XPS) along with what relates and differentiates XPS and PES. Topics included range from sample handling, methodology development, instrument operation, automation, quantification to data interpretation. This is tied up with a selection of lab, fab and synchrotron based case studies.
Students through to practitioners in the areas of chemistry, physics, and/or material science will find this an authoritative resource for understanding and applying XPS and related techniques.
Table of Contents
Foreword xii
Preface To First Edition xv
Preface To Second Edition xvii
Acknowledgments xix
List Of Constants xx
List Of Abbreviations xxi
List Of Symbols xxvii
Pivotal Timelines xxviii
SECTION I : Background Concepts & Instrumentation 1
1 Introduction 3
1.1 Physical Properties Of Matter & The Societal Impacts Realized 3
1.2 Surfaces Of Matter & The Technological Impacts Realized 6
1.3 Surface Science 10
1.4 XPS & PES 12
1.5 History Of XPS 15
1.6 Physical Basis Of XPS 21
1.7 Sensitivity & Specificity Of XPS 26
1.8 Summary 28
References 30
2 Atomic & Electronic Structure 34
2.1 The Atom 34
2.1.1 Atoms & Matter 35
2.1.2 Electronic Structure Of Atoms 39
2.1.2.1 Quantum Numbers 41
2.1.2.2 Stationary-State Notation 42
2.1.2.3 Stationary-State Transitions & Notation 44
2.1.2.4 Stationary-State Energies 46
2.1.2.5 Spin Orbit Splitting 48
2.1.2.6 Ionization Potentials & Electron Affinities 50
2.1.3 Bonding & The Electronic Structure In Solids 51
2.1.3.1 Metal, Semiconductor & Insulator Band Structures 52
2.1.3.2 Band Bending & Band Alignment 54
2.2 Summary 58
References 60
3 Instrumentation I 62
3.1 Components 62
3.1.1 Photon Sources 63
3.1.2 Photon Filtering & Focusing 73
3.1.3 Electron Sources 79
3.1.4 Ion Sources 80
3.1.5 Electron Extraction & Transfer 83
3.1.6 Electron Energy Analyzers 84
3.1.7 Electron Amplification & Detection 91
3.2 Summary 96
References 98
4 Instrumentation II 102
4.1 Systems 102
4.1.1 Vacuum 103
4.1.2 Energy 112
4.1.3 Imaging 119
4.1.4 Related Techniques 127
4.1.5 Automation 142
4.2 Summary 146
References 147
SECTION II : Data Acquisition & Interpretation 152
5 Data Collection & Quantification 154
5.1 Analysis Procedures 154
5.2 Photoelectron Intensities 162
5.3 Information As A Function Of Depth 175
5.4 Summary 194
References 196
6 Speciation & Band-Structure 199
6.1 Spectral Interpretation 199
6.2 Band-Structure Measurements 244
6.3 Scientific Rigor & Reporting 248
6.4 Summary 250
References 252
7 Spectral Simulations 259
7.1 Computational Methods 259
7.2 Summary 270
References 270
8 Case Studies 273
8.1 Introduction 274
8.2 Summary 300
References 301
APPENDICES 304
Appendix A Periodic Table Of The Elements 306
Appendix B Core Level & Fluorescence Notation 307
Appendix C Electron Binding Energies 308
Appendix D Elemental Work Functions 314
Appendix E Line Shapes 318
Appendix F Optical Properties 322
Appendix G Other Spectroscopies/Spectrometries 325
Appendix H Other Microscopies/Tomographies 337
Appendix I Reflection/Diffraction Techniques 347
Glossary Of Terms 350
Hardware Vendors 360
Software Suppliers 363
Index 364
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