電子パッケージングのための確率的有限要素モデリング<br>Stochastic Finite Element Modeling in Electronic Packaging

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¥23,619
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電子パッケージングのための確率的有限要素モデリング
Stochastic Finite Element Modeling in Electronic Packaging

  • 著者名:Chu, Liu
  • 価格 ¥15,364 (本体¥13,968)
  • Wiley-IEEE Press(2026/01/06発売)
  • GWに本を読もう!Kinoppy 電子書籍・電子洋書 全点ポイント30倍キャンペーン(~5/6)
  • ポイント 4,170pt (実際に付与されるポイントはご注文内容確認画面でご確認下さい)
  • 言語:ENG
  • ISBN:9781394352944
  • eISBN:9781394352951

ファイル: /

Description

An expert integration of digital twin technology and advanced simulation methods for the design and optimization of electronic packaging systems

In Stochastic Finite Element Modeling in Electronic Packaging, distinguished researcher Liu Chu delivers an expert discussion of the latest advanced numerical methods and modeling techniques specific to electronic packaging. The book supplements its explanations with original MATLAB and ANSYS (APDL) code that can be applied immediately. It also includes robust examples that draw on a comprehensive description of the mechanics of electronic packaging modeling.

Chu explains the fundamentals of modeling logic and concepts in an accessible way that is ideal for beginners to the topic. She demonstrates practical guides and benchmarks that will assist readers in the testing, measurement, and modeling of their own materials.

Readers will also find:

  • A thorough introduction to a modeling approach that focuses on digital twins and big data applications, including Monte Carlo Sampling
  • Comprehensive explorations of benchmarks, testing, measurement, and modeling
  • Practical discussions of theoretical finite element models in electronic packaging
  • Complete treatments of the fundamentals of modeling logic and concepts

Perfect for undergraduate and graduate students in electrical engineering and computer science, Stochastic Finite Element Modeling in Electronic Packaging will also benefit practicing electronic design engineers and academic researchers with an interest in electronic packaging and materials science.

Table of Contents

About the Author xi

Preface xiii

1 Overview 1

2 Electronic Packaging 7

3 Random Sampling Methods 23

4 Random Fields and Stochastic Processes 39

5 Reliability Prediction 57

6 Finite Element Method 85

7 Nonlinear Stochastic Finite Element Method 115

8 Random Shear Stress and Thermal Temperature 151

9 Material Uncertainty in Electromigration 181

10 Mechanical Reliability in the Replaceable Integrated Chiplet Assembly 203

11 Kriging Surrogate Model 215

12 Digital Twins Based on SFEM 243

Appendix 259

Index 269

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