Description
Terahertz time-domain spectroscopy (THz-TDS) is a unique technique for characterizing the response of materials and devices in the far-infrared region of the electromagnetic spectrum. Based on the measurement of transmitted or reflected ultra-short electromagnetic pulses and on a Fourier-transform of the recorded waveforms, THz-TDS permits fast and precise determination of the permittivity or permeability of materials over a wide bandwidth. This book is devoted to the determination of this spectral response of samples from the recorded waveforms.
Table of Contents
Introduction
The THz Frequency Range
Classical Far-Infrared Spectroscopy Techniques
THz-TDS Instrumentation
Extracting the Refractive Index from Transmission TDS Data
Extracting the Refractive Index from Reflection TDS Data
Pump-and-Probe THz-TDS
Waveguides, Metamaterials and Plasmonic Devices
Characterization of Anisotropic Materials
THz-TDS of Scattering Samples
Noise in THz-TDS Systems
Precision of the THz-TDS Extraction
Advanced Techniques
