Using Imperfect Semiconductor Systems for Unique Identification〈1st ed. 2017〉

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Using Imperfect Semiconductor Systems for Unique Identification〈1st ed. 2017〉

  • 著者名:Roberts, Jonathan
  • 価格 ¥17,025 (本体¥15,478)
  • Springer(2017/09/14発売)
  • ポイント 154pt (実際に付与されるポイントはご注文内容確認画面でご確認下さい)
  • 言語:ENG
  • ISBN:9783319678900
  • eISBN:9783319678917

ファイル: /

Description

This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques.

Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad.

Table of Contents

An Introduction to Security Based on Physical Disorder.- An Introduction to Semiconductors and Quantum Confinement.- Sample Preparation and Experimental Techniques.- Unique Identification with Resonant Tunneling Diodes.- Langmuir-Blodgett Deposition of 2D Materials for Unique Identification.- Building Optoelectronic Heterostructures with the Langmuir-Blodgett Technique.- Conclusions and Future Work.

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