Process Monitoring, Fault Diagnosis, and Tolerant Control for Complex Industrial Systems : A Festschrift in Honor of Professor Steven X. Ding on the Occasion of His Retirement (Lecture Notes in Control and Information Sciences)

Luo, Hao (EDT)/ Chen, Zhiwen (EDT)/ Li, Linlin (EDT)

Springer Nature Switzerland AG（2025/11発売）

• 製本 Hardcover:ハードカバー版／ページ数 699 p.
• 言語 ENG
• 商品コード 9789819690329

Full Description

This open access book details fault diagnosis, prognosis, and tolerant control for complex industrial systems. It is also dedicated to Professor Steven X. Ding for his retirement. This book proposes data-driven quality-related fault diagnosis schemes based on space projection for linear/nonlinear systems. It also introduces credible and efficient fault prognosis techniques for complex industrial systems. It combines fault detection and re-configuration toward the design of fault-tolerant control methods. It will be a useful reference for students and researchers working on fault diagnosis.

 

Contents

Preface.- Operator-in-the-Loop Bayesian Optimization Towards Optimal Process Operation.- Simultaneous State and Fault Estimation Over Bandwidth-constrained Networks: A Relay-aided Binary Encoding Strategy.- Adaptive Neural Fault-tolerant Observer-based Stabilization of Uncertain MIMO Time-delay Nonlinear Systems with Dead-zones and Faults in Actuators.- Nonlinear Fault-tolerant Tracking Control for DC-DC Boost Converters with Measurement Faults.- Mirror Attacks on Cyber-Physical Systems.