X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

Sando, Daniel (EDT)/ Evans, Paul (EDT)/ Valanoor, Nagarajan (EDT)

Springer Nature Switzerland AG（2025/07発売）

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製本 Hardcover:ハードカバー版／ページ数 220 p.
言語 ENG
商品コード 9789819659449

Full Description

The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.