Migration Imaging of the Transient Electromagnetic Method

Li, Xiu/ Xue, Guoqiang/ Yin, Changchun

Springer Verlag, Singapore（2018/06発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 139 p.
• 言語 ENG
• 商品コード 9789811096884
• DDC分類 526.1

Full Description

This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area. It present and analyzes transforming principles, TEM wave field methods, characteristics of the TEM virtual wave field and studies on many significant related technologies. The coverage is supplemented by a wealth of 1-D, 2-D and 3-D figures to illustrate pseudo-seismic theory. The book offers a valuable resource for teachers, students, researchers and engineers in the fields of geophysics, earth exploration and information technology.

Contents

Development and prospect of transient electromagnetic method.- Theory and technology of full-zone wave-field transformation.- Property of TEM Pseudo Wave-Field.- Synthetic Aperture Algorithms and Compression of Wavelet Width.- Surface Continuation and Imaging of TEM Based on Pseudo Wave Equations.- Velocity analysis of TEM pseudo wave field.- Imaging of Theoretical Model and field examples.