Theoretical Concepts of X-Ray Nanoscale Analysis : Theory and Applications (Springer Series in Materials Science)

Benediktovich, Andrei/ Feranchuk, Ilya/ Ulyanenkov, Alexander

Springer-Verlag Berlin and Heidelberg GmbH & Co. K（2016/08発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 318 p.
• 商品コード 9783662520543

Full Description

The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.