Scanning Force Microscopy of Polymers (Springer Laboratory)

Vancso, G. Julius/ Schönherr, Holger

Springer-Verlag Berlin and Heidelberg GmbH & Co. K（2016/08発売）

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製本 Paperback:紙装版/ペーパーバック版／ページ数 248 p.
言語 ENG
商品コード 9783662517499

Full Description

Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5].