Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions (Springer Series in Materials Science)

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Point Defects in Semiconductors and Insulators : Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions (Springer Series in Materials Science)

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  • 製本 Paperback:紙装版/ペーパーバック版／ページ数 492 p.
  • 言語 ENG
  • 商品コード 9783642627224
  • DDC分類 620.11

Full Description

The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap­ peared about 10 years ago.

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