Noncontact Atomic Force Microscopy Vol.2 (Nanoscience and Technology) （2013. XVIII, 401 S. 28 SW-Abb., 77 Farbabb., 7 Tabellen. 235 mm）

Herausgegeben von Morita, Seizo/ Giessibl, Franz J./ Wiesendanger, Roland

SPRINGER, BERLIN（2013/12発売）

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製本 Paperback:紙装版/ペーパーバック版
商品コード 9783642260704

Full Description

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;