Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials

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Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials

Breitenstein, O./ Warta, W.

Springer（2009/10発売）

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製本 Hardcover:ハードカバー版／ページ数 250 p.
言語 ENG
商品コード 9783642024160

Full Description

Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application ?elds of lock-in thermography were established by implying irradiation of light during the measurements.