Advances in Speckle Metrology and Related Techniques （2011. XIV, 326 p. w. 170 figs. 240 mm）

Ed. by Kaufmann, Guillermo H.

WILEY-VCH（2011発売）

• 製本 Hardcover:ハードカバー版／ページ数 327 p.
• 商品コード 9783527409570

基本説明

Edited by the Chair of the Speckle 2010 Conference.

Full Description

Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches.

This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.

Contents

1. Radial Speckle Interferometry and Applications
2. Depth-Resolved Displacement Field Measurement
3. Single-Image Interferogram Demodulation
4. Phase Evaluation in Temporal Speckle Pattern Interferometry using Time-Frequency Methods
5. Optical Vortex Metrology
6. Speckle Coding for Optical and Digital Data Security Applications