Testing of Interposer-Based 2.5D Integrated Circuits

Wang, Ran/ Chakrabarty, Krishnendu

Springer International Publishing AG（2018/05発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 182 p.
• 言語 ENG
• 商品コード 9783319854618
• DDC分類 004.1

Full Description

This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits.  The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies.  This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable.

Contents

Introduction.- Pre-Bond Testing of the Silicon Interposer.- Post-Bond Scan-based Testing of Interposer Interconnects.- Test Architecture and Test-Path Scheduling.- Built-In Self-Test.- ExTest Scheduling and Optimization.- A Programmable Method for Low-Power Scan Shift in SoC Dies.- Conclusions.-