- ホーム
- > 洋書
- > ドイツ書
- > Mathematics, Sciences & Technology
- > Technology
Full Description
This book serves as a "go-to" guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip. The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.
Contents
Introduction to Analog and Mixed-Signal test.- Analog and mixed-signal test equipment.- Design-for-test techniques for AMS-IC.- Alternate test.- Yield and test cost optimization.- Emerging test methods.



