Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects

Morniroli, Jean- Paul

Institute of Physics Publishing（2004/11発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 450 p.
• 言語 ENG
• 商品コード 9782901483052
• DDC分類 548.7

Full Description

A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.

Contents

Introduction I - Bragg's law II - Formation of the diffraction pattern in the electron microscope III- Electron diffraction patterns produced by a parallel incident beam IV- Diffraction pattern produced by a convergent incident beam: CBED pattern V - Diffraction pattern produced by a large-angle convergent incident beam: Kossel pattern VI - Diffraction pattern produced by a large-angle convergent beam: LACBED Patterns VII- Diffracted and transmitted intensities XI - Characterization of crystal defects from LACBED patterns VIII- Experimental methods IX- LACBED variants X - Indexing LACBED patterns Conclusion