Advanced Characterization of Thin Film Solar Cells (Energy Engineering)

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Advanced Characterization of Thin Film Solar Cells (Energy Engineering)

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  • 製本 Hardcover:ハードカバー版/ページ数 456 p.
  • 言語 ENG
  • 商品コード 9781839530234
  • DDC分類 621.472

Full Description

Polycrystalline thin-film solar cells have reached a levelized cost of energy that is competitive with all other sources of electricity. The technology has significantly improved in recent years, with laboratory cell efficiencies for cadmium telluride (CdTe), perovskites, and copper indium gallium diselenide (CIGS) each exceeding 22 percent. Both CdTe and CIGS solar panels are now produced at the gigawatt scale. However, there are ongoing challenges, including the continued need to improve performance and stability while reducing cost. Advancing polycrystalline solar cell technology demands an in-depth understanding of efficiency, scaling, and degradation mechanisms, which requires sophisticated characterization methods. These methods will enable researchers and manufacturers to improve future solar modules and systems.

This work provides researchers with a concise overview of the status of thin-film solar cell technology and characterization. Chapters describe material systems and their properties and then provide an in-depth look at relevant characterization methods and the learning facilitated by each of these.

Following an introductory chapter, the book provides systematic and thorough coverage of the following topics: trends to improve CdTe solar cell performance; C (In,Ga)Se2 and related materials; perovskite solar cells; photovoltaic device modelling; luminescence and thermal imaging of thin-film photovoltaic materials, devices, and modules; application of spatially resolved spectroscopy characterization techniques on Cu2ZnSnSe4 solar cells; time-resolved photoluminescence characterization of polycrystalline thin-film solar cells; fundamentals of electrical material and device spectroscopies applied to thin-film polycrystalline chalcogenide solar cells; nanometer-scale characterization of thin-film solar cells by atomic force microscopy-based electrical probes; scanning transmission electron microscopy characterization of solar cells; photoelectron spectroscopy methods in solar cell research; time-of-flight secondary-ion mass spectrometry and atom probe tomography; and solid-state nuclear magnetic resonance characterization for photovoltaic applications. The final chapter provides an overview and describes future prospects.

Contents

Chapter 1: Introduction - Motivation of polycrystalline thin-film solar cells
Chapter 2: Patterns in the control of CdTe solar cell performance
Chapter 3: Cu(In,Ga)Se2 and related materials
Chapter 4: Perovskite solar cells
Chapter 5: Photovoltaic device modeling: a multi-scale, multi-physics approach
Chapter 6: Luminescence and thermal imaging of thin-film photovoltaic materials, devices, and modules
Chapter 7: Application of spatially resolved spectroscopy characterization techniques on Cu2ZnSnSe4 solar cells
Chapter 8: Time-resolved photoluminescence characterization of polycrystalline thin-film solar cells
Chapter 9: Fundamentals of electrical material and device spectroscopies applied to thin-film polycrystalline chalcogenide solar cells
Chapter 10: Nanometer-scale characterization of thin-film solar cells by atomic force microscopy-based electrical probes
Chapter 11: STEM characterization of solar cells
Chapter 12: Photoelectron spectroscopy methods in solar cell research
Chapter 13: Time-of-flight secondary-ion mass spectrometry and atom probe tomography
Chapter 14: Solid-state NMR characterization for PV applications
Chapter 15: Summary and outlook

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