A Practical Guide to Transmission Electron Microscopy, Volume II : Advanced Microscopy (Materials Characterization and Analysis Collection)

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A Practical Guide to Transmission Electron Microscopy, Volume II : Advanced Microscopy (Materials Characterization and Analysis Collection)

Luo, Zhiping

ウェブストア価格 ¥14,281（本体¥12,983）
Momentum Press（2015/12発売）
外貨定価 US$ 79.95
ポイント 129pt

オンデマンド(OD/POD)版です。キャンセルは承れません。

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製本 Paperback:紙装版/ペーパーバック版／ページ数 178 p.
言語 ENG
商品コード 9781606509173

Full Description

Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.