Engineering Applications of the Modulated Scatterer Technique

Bolomey, Jean-Charles/ Gardiol, Fred

Artech House Publishers（2001/08発売）

• 製本 Hardcover:ハードカバー版／ページ数 280 p.
• 言語 ENG
• 商品コード 9781580531474
• DDC分類 620.0044

Full Description

Due to the spectacular growth of electronic systems and the steady demand for new services with increased functionality, the development of more efficient measurement techniques has become of paramount importance. This practical resource details the cutting-edge Modulated Scatterer Technique, which offers a low-invasive and rapid method for testing and maesuring systems and equipment used in a wide range of electronic engineering applications. Extensively refrenced with 125 illustrations and 100 equations.

Contents

Preface. Foreword. Introduction - Where Near Field Measurements Are Useful. Near Field Basics. Direct And Indirect Measurements. Modulated Scatterer Technique. Some Field Maps. Basic Scatterer Electromagnetics - Introduction. Principle Of Modulated Scattering. Scattering Matrix Formulation. Probe Response In Various Situations. Calculation Of The Probe Response. Free Space Measurements. Application With Different Kinds Of Probes. Mobile probe setups - Low Invasiveness. Sensitivity. Spatial Resolution. Optical Analogy with Near-Field Microscopy. Probe Interaction with Its Environment. Examples of Applications. Probe Arrays - Minimizing the Duration of the Measurements. Specific Difficulties Associated with Probe Arrays. The Modulated Scattering Approach to Probe Arrays (Retina, Collector). Different Probe Array Arrangements (Reflection, Transmission) Different Modulation Schemes (Series, Parallel). Modulated Vs Standard Probe Arrays. Examples of Applications. Conclusion. List of Symbols and Notations. Appendices.