Atom-Probe Tomography : The Local Electrode Atom Probe

Miller, Michael K./ Forbes, Richard G.

Springer-Verlag New York Inc.（2016/09発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 423 p.
• 言語 ENG
• 商品コード 9781489977908
• DDC分類 616.075722

Full Description

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.

Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.