Advanced Techniques for Materials Characterization (Materials Science Foundations)

Tyagi, A.K./ Roy, Mainak/ Kulshreshtha, S.K.

Trans Tech Publications Ltd（2009/01発売）

• 製本 Paperback:紙装版/ペーパーバック版／ページ数 528 p.
• 言語 ENG
• 商品コード 9780878493791
• DDC分類 620.11

Full Description

Volume is indexed by Thomson Reuters BCI (WoS).
Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.

Contents

Preface
Dr. A.K. Tyagi
Dr. Mainak Roy
Dr. S.K. Kulshreshtha
Dr. S. Banerjee
1. Diffraction Techniques
1.1 Characterization of Crystalline Materials with Powder X-Ray Diffraction (XRD)
1.2 Study of Nuclear (Chemical) and Magnetic Structures Using Neutron Scattering
1.3 Use of SANS and SAXS in Studying Nanoparticles
2. Spectroscopic Techniques
2.1 IR Spectroscopy: Applications in Material Characterization
2.2 Raman Spectroscopic Technique for Materials Characterization
2.3 Structural Aspects of Zeolites and Oxide Glasses: Insights from Solid State Nuclear Magnetic Resonance
2.4 Electron Paramagnetic Resonance (EPR) Spectroscopy in Material Characterization
2.5 Positron Annihilation Spectroscopy
2.6 Mössbauer Spectroscopy and its Applications
3. Compositional Characterization Techniques
3.1 Mass Spectrometry for Characterization of Materials
3.2 Neutron Activation Analysis and Applications
3.3 Atomic Absorption, Emission and Mass Quantification in the Elemental Characterization of Materials
3.4 Microanalysis by Electron Beam
3.5 Compositional Characterization of Surfaces with Ion Beam Analysis
4. Synchroton and Surface Techniques
4.1 Synchrotron Radiation and its Application for Material Characterization
4.2 Materials Characterization Using Surface Analytical Techniques: X-ray Photoelectron Spectroscopy
5. Microscopic Techniques
5.1 Atomic Force Microscope (AFM) in Chemistry, Biology and Material Science
5.2 Particle Characterization by Light Scattering
5.3 Characterization of Nanostructures by Transmission Electron Microscopy
5.4 Principles and Applications of SEM and EDAX