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基本説明
"... an excellent book that covers this extremely important topic very well...the editors have done a thorough job in putting together a complete summary of the important issues in this area. For a range of device technologies, the main themes that need to be addressed including measurement, extraction, DC and non-linear modelling, noise modelling, thermal issues and package modelling are covered in a clear but detailed manner, by experts in each area. I would highly recommend this title." John Atherton, WIN Semiconductors.
Full Description
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction.
Contents
1. Introduction M. Rudolph; 2. DC and thermal modeling: III-V FETs and HBTs M. Iwamoto, J. Xu and D. E. Root; 3. Extrinsic parameter and parasitic elements in III-V HBT and HEMT modeling S. R. Nedeljkovic, W. J. Clausen, F. Kharabi, J. R. F. McMacken and J. M. Gering; 4. Uncertainties in small-signal equivalent circuit modeling C. Fager, K. Andersson and M. Ferndahl; 5. The large-signal model: theoretical foundations, practical considerations, and recent trends D. E. Root, J. Horn, J. Xu and M. Iwamoto; 6. Large and packaged transistors J. Engelmann, F.-J. Schmückle and M. Rudolph; 7. Characterization and modeling of dispersive effects O. Jardel, R. Sommet, J.-P. Teyssier and R. Quéré; 8. Optimizing microwave measurements for model construction and validation D. Schreurs, M. Myslinski and G. Crupi; 9. Practical statistical simulation for efficient circuit design P. Zampardi, Y. Yang, J. Hu, B. Li, M. Fredriksson, K. Kwok and H. Shao; 10. Noise modeling M. Berroth.
