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Full Description
Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
Contents
Preface
Numerical Methods for Computing Electrostatic and Magnetic Fields
Methods of Computing Optical Properties and Combating Aberrations for Low-Intensity Beams
Emittance and Brightness: Definitions and Measurements*
High-Resolution Scanning Transmission Low-Energy Ion Microscopes and Microanalyzers
High-Energy Ion Microprobes



