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Full Description
Advances in Imaging and Electron Physics, Volume 237 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
Contents
Stochastic geometry with applications in materials science
Morphological models of random media
Grain models and application to microstructure simulation
MCMC algorithms for model parameterization
Tessellations models
Tesselation models
Fast simulation of tessellation models using Eikonal equation
Applications to Image Processing
Synthesis of Training Images for Supervised Learning Problems
Segmentation Methods Based on the Eikonal Equation



