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Full Description
BSIM-SOI Industry-Standard Compact Model: Surface Potential-Based FET Model for RFIC Design provides complete coverage of compact modeling and design techniques specific to SOI transistors. It is designed to be the first comprehensive guide that thoroughly explains the industry-standard BSIM-SOI compact model, along with the unique modeling and RF design techniques necessary for the accurate extraction and implementation of the industry standard BSIM-SOI model. BSIM-SOI is the most widely used compact model in the semiconductor industry. This book will equip designers, engineers, and researchers with the knowledge and tools required to optimize SOI-based circuit performance and system integration. The book explains the fundamental surface-potential calculations and addresses various real device effects, such as floating body, self-heating, and dynamic depletion effects, and layout influences, to accurately replicate realistic device behavior. Additionally, the step-by-step parameter extraction procedures for the BSIM-SOI model are outlined and the results of benchmark tests are also presented. This book will be a valuable reference for the expanding field of SOI technology, catering specifically to circuit designers, device engineers, academic researchers, and students.
Contents
1. General overview of SOI models and technology trends
2. Core model formulation
3. Real device effects
4. Terminal charges and capacitances
5. Leakage currents
6. Noise models in BSIM-SOI
7. Body contact parasitics - modeling approach
8. Self-Heating and Temperature Effects
9. Cutting-Edge RF Modeling and Validation Techniques
10. Integrating BSIM-SOI Models in Analog, Digital, and RF Designs
11. Parameter Extraction
12. Model Quality testing
