走査プローブ顕微鏡：ナノスケールにおける電気・電気機械的現象（全２巻） Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale : Fundamentals and Applications （2006. IV, 1074 p.. w. 350 figs.）

Kalinin, Sergei/ Gruverman, Alexei

springer（2006発売）

• 製本 Hardcover:ハードカバー版／ページ数 1,074 p.／サイズ 350 illus.
• 言語 ENG
• 商品コード 9780387286679

基本説明

Presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication.

Full Description

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Contents

SPM Techniques for Electrical Characterization.- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport.- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy.- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics.- Principles of Kelvin Probe Force Microscopy.- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy.- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy.- Principles of Near-Field Microwave Microscopy.- Electromagnetic Singularities and Resonances in Near-Field Optical Probes.- Electrochemical SPM.- Near-Field High-Frequency Probing.- Electrical and Electromechanical Imaging at the Limits of Resolution.- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors.- Spin-Polarized Scanning Tunneling Microscopy.- Scanning Probe Measurements of Electron Transport in Molecules.- Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices.- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks.- Theory of Scanning Probe Microscopy.- Multi-Probe Scanning Tunneling Microscopy.- Dynamic Force Microscopy and Spectroscopy in Vacuum.- Scanning Tunneling Microscopy and Spectroscopy of Manganites.- Electrical SPM Characterization of Materials and Devices.- Scanning Voltage Microscopy.- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces.- Electromechanical Behavior in Biological Systems at the Nanoscale.- Scanning Capacitance Microscopy.- Kelvin Probe Force Microscopy of Semiconductors.- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy.- Electron Flow Through MolecularStructures.- Electrical Characterization of Perovskite Nanostructures by SPM.- SPM Measurements of Electric Properties of Organic Molecules.- High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices.- Electrical Nanofabrication.- Electrical SPM-Based Nanofabrication Techniques.- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation.- UHV-STM Nanofabrication on Silicon.- Ferroelectric Lithography.- Patterned Self-Assembled Monolayers via Scanning Probe Lithography.- Resistive Probe Storage: Read/Write Mechanism.