Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing Vol.31) (2006. XX, 250 p.)

Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing Vol.31) (2006. XX, 250 p.)

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  • 製本 Hardcover:ハードカバー版/ページ数 250 p.
  • 言語 ENG
  • 商品コード 9780387249933

基本説明

Makes various data mining and diagnostic techniques available in one place to professionals; Presents a new diagnosis technique SLAT – single location at a time.

Full Description

The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.

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