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Full Description
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials.
This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes.
Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization.
Contents
1. Scanning Electron Microscopy, ESEM, and X-Ray Microanalysis
2. Synthesis of Scanning Electron Microscopy Images of Nanostructures by High-Performance Monte Carlo Modeling
3. Scanning electron microscopy under gaseous environment
4. Transmission Electron Microscopy of Nanostructures
5. Plasmonic and Non-Plasmonic Characterization of Nanomaterials
6. Characterization of Materials, Nanomaterials, and Thin-Films by Nanoindentation
7. Super Resolution Optical Microscopy
8. X-ray Microanalysis and Electron Energy Loss Spectroscopy (EELS)
9. Wide Angle X-Ray Diffraction (WXRD)
10. Small Angle Neutron Scattering (SANS)
11. Auger Electron Spectroscopy
12. Energy Dispersive X-ray Spectroscopy Techniques for Nanomaterials
