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Full Description
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution.
This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
Contents
1: Introduction
2: Instrumental Aspects of AFM
3: AFM Modes
4: Measuring AFM Images
5: Image Processing in AFM
6: Image Artifacts in AFM
7: Applications of AFM
Appendix 1: AFM Standards and Calibration Specimens
Appendix 2: AFM Software
