The Rietveld Method (International Union of Crystallography Monographs on Crystallography)

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The Rietveld Method (International Union of Crystallography Monographs on Crystallography)

Young

ウェブストア価格 ¥25,325（本体¥23,023）
Oxford University Press（1995/01発売）
外貨定価 US$ 110.00
ポイント 230pt

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製本 Paperback:紙装版/ペーパーバック版／ページ数 308 p.
言語 ENG
商品コード 9780198559122
DDC分類 548.83

基本説明

New in paperback. Hardcover was published in 1993.

Full Description

The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level.

This book, a collaboration by many authorities in the field, has tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter enables the book to be used as a first text for researchers starting in this area of science.

R.A. Young: Introduction to the Rietveld Method; H.M. Rietveld: The early days: a retrospective view; E. Prince: Mathematical aspects of Rietveld refinement; T.M. Sabine: The flow of radiation in a polycrystalline material; R.J. Hill: Data collection strategies: fitting the experiment to the need; J.W. Richardson jr: Background modelling in Rietveld analysis; R.L. Snyder: Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis; R. Delhez, Th. H. de Keijser, J.I. Langford, D. Louër, E.J. Mittemeijer, and E.J. Sonneveld: Crystal imperfection broadening and peak shape in the Rietveld method; P. Suortti: Bragg reflection profile shape in X-ray powder diffraction patterns; C. Bärlocher: Restraints and constraints in Rietveld refinement; W.I.F. David, & J.D. Jorgensen: Rietveld refinement with time-of-flight powder diffraction from pulsed neutron sources; R.B. von Dreele: Combined X-ray and neutron Rietveld refinement; F. Izumi: Rietveld analysis programs Rietan and Premos and special applications; H. Toraya: Position-constrained and unconstrained powder-pattern-decomposition methods; A.K. Cheetham: Ab initio structure solutions with powder diffraction data.