Reliability Characterisation of Electrical and Electronic Systems (Woodhead Publishing Series in Electronic and Optical Materials) （2ND）

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Reliability Characterisation of Electrical and Electronic Systems (Woodhead Publishing Series in Electronic and Optical Materials) （2ND）

Swingler, Jonathan (EDT)

ウェブストア価格 ¥52,096（本体¥47,360）
Woodhead Publishing Ltd（2025/02発売）
外貨定価 US$ 250.00
ポイント 473pt

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製本 Paperback:紙装版/ペーパーバック版／ページ数 350 p.
言語 ENG
商品コード 9780081029633
DDC分類 621.381

Full Description

The book charts how reliability engineering has moved from the use of sometimes arbitrary standards to an empirical scientific approach of understanding operating conditions, failure mechanisms, the need for testing for a more realistic characterisation and, new for the second edition, includes the monitoring of performance/robustness in the field.

Reliability Characterisation of Electrical and Electronic Systems brings together a number of experts and key players in the discipline to concisely present the fundamentals and background to reliability theory, elaborate on the current thinking and developments behind reliability characterisation, and give a detailed account of emerging issues across a wide range of applications.

The second edition has a new section titled Reliability Condition Monitoring and Prognostics for Specific Application which provides a guide to critical issues in key industrial sectors such as automotive and aerospace. There are also new chapters on areas of growing importance such as reliability methods in high-temperature electronics and reliability and testing of electric aircraft power systems.

1. Introduction 2. A quick guide to the fundamentals

PART 1 Reliability Science and Engineering Fundamentals 3. Reliability and stupidity: mistakes in reliability engineering and how to avoid them 4. Physics-of-failure (PoF) methodology for electronic reliability 5. Modern instruments for characterizing degradation in electrical and electronic equipment

PART 2 Reliability Methods for Components and System Development 6. Reliability building of discrete electronic components 7. Reliability of optoelectronics 8. Reliability of silicon integrated circuits 9. Reliability of emerging nanodevices 10. Design considerations for reliable embedded systems

PART 3 Reliability Modelling and Testing in Specific Applications 11. Reliability approaches for automotive electronic systems 12. Reliability modeling and testing of 'More-Electric-Aircraft' power systems 13. Reliability modeling and accelerated life testing for solar power generation systems

PART 4 Reliability Condition Monitoring and Prognostics for Specific Applications 14. Automotive, electric vehicles 15. Aerospace 16. Electricity Energy Supply