Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization
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Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization  Paperback,  言語:ENG

Tan, Sheldon/ Tahoori, Mehdi/ Kim, Taeyoung

  • ウェブストア価格 ¥37,577(本体¥34,161)
  • Springer Nature Switzerland AG(2020/09発売)
  • ポイント 341pt
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