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Built-in Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design : A Self-test, Self-diagnosis, and Self-repair-based Approach
  • 洋書

Built-in Fault-tolerant Computing Paradigm for Resilient Large-scale Chip Design : A Self-test, Self-diagnosis, and Self-repair-based Approach  Hardcover,  言語：ENG

Li, Xiaowei/ Yan, Guihai/ Liu, Cheng

  • ウェブストア価格 ¥48,010（本体¥43,646）
  • Springer Verlag, Singapore（2023/02発売）
  • ポイント 436pt
  • 海外取次在庫
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
  • 洋書

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach  Paperback,  言語：ENG

Li, Xiaowei/ Yan, Guihai/ Liu, Cheng

  • ウェブストア価格 ¥49,179（本体¥44,709）
  • Springer Verlag, Singapore（2024/03発売）
  • ポイント 447pt
  • 海外からお取り寄せ（通常6～9週間）
1～2件／全2件
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