Optical Admittance Loci Monitoring for Thin Film Deposition : Optical Monitoring for Thin Film Coatings (Aufl. 2012. 148 S. 220 mm)
  • 洋書

Optical Admittance Loci Monitoring for Thin Film Deposition : Optical Monitoring for Thin Film Coatings (Aufl. 2012. 148 S. 220 mm)  Paperback

Lee, Cheng-Chung/ Wu, Kai/ Ni, Tzu-Ling

  • ウェブストア価格 ¥14,595(本体¥13,269)
  • LAP LAMBERT ACADEMIC PUBLISHING(2012発売)
  • ポイント 132pt
  • オンデマンド(OD/POD)版です。キャンセルは承れません。
Advanced and Applied Studies on Ultra-Trace Rare Earth Elements (REEs) in Carbonates Using SN-ICPMS and LA-ICPMS (Springer Theses) (2021)
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Advanced and Applied Studies on Ultra-Trace Rare Earth Elements (REEs) in Carbonates Using SN-ICPMS and LA-ICPMS (Springer Theses) (2021)  Hardcover,  言語:ENG

Wu, Chung-Che

  • ウェブストア価格 ¥35,183(本体¥31,985)
  • Springer Verlag, Singapore(2021/08発売)
  • ポイント 319pt
  • 海外取次在庫
Advanced and Applied Studies on Ultra-Trace Rare Earth Elements (REEs) in Carbonates Using SN-ICPMS and LA-ICPMS (Springer Theses)
  • 洋書

Advanced and Applied Studies on Ultra-Trace Rare Earth Elements (REEs) in Carbonates Using SN-ICPMS and LA-ICPMS (Springer Theses)  Paperback,  言語:ENG

Wu, Chung-Che

  • ウェブストア価格 ¥35,183(本体¥31,985)
  • Springer Verlag, Singapore(2022/08発売)
  • ポイント 319pt
  • 海外取次在庫