Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)  Paperback,  言語:ENG

Franco, Jacopo/ Kaczer, Ben/ Groeseneken, Guido

  • ウェブストア価格 ¥22,196(本体¥20,179)
  • Springer(2016/08発売)
  • ポイント 201pt
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