X-Ray Microscopy II : Proceedings of the International Symposium, Brookhaven, NY, August 31 September 4, 1987 (Springer Series in Optical Sciences .56) (2013. xiv, 455 S. XIV, 455 p. 288 illus., 2 illus. in color. 229 mm)
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X-Ray Microscopy II : Proceedings of the International Symposium, Brookhaven, NY, August 31 September 4, 1987 (Springer Series in Optical Sciences .56) (2013. xiv, 455 S. XIV, 455 p. 288 illus., 2 illus. in color. 229 mm)  Paperback,  言語:ENG

Herausgegeben von Sayre, David/ Howells, Malcolm/ Kirz, Janos/ Rarback, Harvey

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  • SPRINGER, BERLIN; SPRINGER BERLIN HEIDELBERG; SPRINGE(2013発売)
  • ポイント 121pt
  • 海外取次在庫