Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings)
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Frontiers of Characterization and Metrology for Nanoelectronics (Aip Conference Proceedings)  Hardcover,  言語:ENG

Secula, Erik M. (EDT)/ Seiler, David G. (EDT)/ Khosla, Rajinder P. (EDT)

  • American Institute of Physics(2009/10発売)
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