Assessment and Application of Defect Characterization via Lifetime Spectroscopy in High Purity C-Si. : Dissertationsschrift (Solar Energy and Systems Research) (2023. 174 S. num., mostly col. illus. and tab. 21.0 cm)
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Assessment and Application of Defect Characterization via Lifetime Spectroscopy in High Purity C-Si. : Dissertationsschrift (Solar Energy and Systems Research) (2023. 174 S. num., mostly col. illus. and tab. 21.0 cm)  Paperback

Post, Regina/ Herausgegeben:Fraunhofer ISE, Freiburg

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  • FRAUNHOFER VERLAG(2023発売)
  • ポイント 188pt
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