Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing) (2011)
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Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing) (2011)  Paperback,  言語:ENG

Nicolaidis, Michael (EDT)

  • Springer-Verlag New York Inc.(2012/11発売)
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On Line-Testing for VLSI (Frontiers in Electronic Testing)
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On Line-Testing for VLSI (Frontiers in Electronic Testing)  Paperback,  言語:ENG

Nicolaidis, Michael (EDT)/ Zorian, Yervant (EDT)/ Pradhan, Dhiraj K. (

  • ウェブストア価格 ¥24,313(本体¥22,103)
  • Springer(2010/12発売)
  • ポイント 221pt
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