Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach
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Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach  言語:ENG

Lall, Pradeep/Pecht, Michael G./Hakim, Edward B.

  • 価格 ¥9,377(本体¥8,525)
  • CRC Press(2020/07/09発売)
  • ポイント 85pt (実際に付与されるポイントはご注文内容確認画面でご確認下さい)