Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)  Paperback,  言語:ENG

Franco, Jacopo/ Kaczer, Ben/ Groeseneken, Guido

  • ウェブストア価格 ¥21,767(本体¥19,789)
  • Springer(2016/08発売)
  • ポイント 197pt
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