Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings  言語:ENG

Bai, Xiao (EDT)/Hancock, Edwin R. (EDT)/Ho, Tin Kam (EDT)/Wilson, Richard C. (EDT)/Biggio, Battista (EDT)/Robles-Kelly, Antonio (EDT)

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  • Springer(2018/08/10発売)
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