Reliability, Yield, and Stress Burn-In : A Unified Approach for Microelectronics Systems Manufacturing & Software Development
  • 洋書

Reliability, Yield, and Stress Burn-In : A Unified Approach for Microelectronics Systems Manufacturing & Software Development  Paperback,  言語:ENG

Way Kuo/ Wei-Ting Kary Chien/ Taeho Kim

  • ウェブストア価格 ¥35,662(本体¥32,420)
  • Springer-Verlag New York Inc.(2014/03発売)
  • ポイント 324pt
  • 海外取次在庫