High Resolution Focused Ion Beams: FIB and its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
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High Resolution Focused Ion Beams: FIB and its Applications : The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology  Paperback,  言語:ENG

Orloff, Jon/ Swanson, Lynwood/ Utlaut, Mark

  • ウェブストア価格 ¥49,803(本体¥45,276)
  • Springer-Verlag New York Inc.(2012/09発売)
  • ポイント 452pt
  • オンデマンド(OD/POD)版です。キャンセルは承れません。